An internationally recognized testing institution, assisting enterprises in achieving technological advancement.
ZHONGXI Testing has obtained inspection qualification certifications from multiple countries and regions worldwide. We possess a senior testing team and advanced testing methods, providing independent, impartial, and professional third-party verification services for global carbon projects.
Certified by multiple international standards such as CNAS, VCS, and GS, with reports universally applicable worldwide.
Covering 140+ countries and regions, it supports on-site detection and remote verification in multiple languages.
Adopt standard experimental methods to ensure accurate and reliable data.
When you search for oxide nanocrystal detection, you are almost certainly preparing to assess the critical attributes of your engineered nanomaterials – whether for catalysis, energy storage, biomedical imaging, optoelectronics, or functional coatings. We understand that the performance of oxide nanocrystals (e.g., ZnO, TiO₂, CeO₂, Fe₃O₄, SnO₂, NiO, Al₂O₃) depends sensitively on size, shape, crystallographic phase, surface chemistry, defect density, and agglomeration state. Our mission is to provide you with the deepest, most actionable characterisation data available, enabling you to optimise synthesis, ensure batch-to-batch consistency, and meet stringent regulatory or industrial specifications.
We deploy an integrated, high-resolution analytical platform that captures every relevant parameter of your oxide nanocrystals, from dry powders to colloidal dispersions and even nanocrystals embedded in matrices:
1. Atomic-Scale Morphology & Size Distribution: Using aberration-corrected scanning transmission electron microscopy (AC-STEM) with sub-Ångström resolution, we visualise individual oxide nanocrystals down to 0.5 nm and measure lattice fringes directly. Combined with automated particle analysis (over 50,000 particles per sample), we provide statistically robust size distributions (D10, D50, D90) with standard deviation < 0.3 nm for monodisperse samples. For colloidal stability, dynamic light scattering (DLS) with multi-angle detection (173° and 13°) delivers hydrodynamic diameter from 0.3 nm to 10 µm and polydispersity index (PDI) to ±0.002.
2. Phase Purity & Crystallinity at Ultimate Sensitivity: Our high-resolution synchrotron X-ray diffraction (HR-XRD) (or benchtop XRD with Cu Kα, rotating anode) using Rietveld refinement quantifies phase fractions, lattice parameters, microstrain, and coherent domain size down to 0.1 wt% for minority phases. For thin films or ultra-small nanocrystals (<2 nm), we perform total scattering pair distribution function (PDF) analysis to reveal local atomic ordering even in nominally “amorphous” oxides. Additionally, selected area electron diffraction (SAED) in TEM confirms individual nanocrystal orientation.
3. Surface Chemistry, Defects & Oxidation States: X-ray photoelectron spectroscopy (XPS) with monochromatic Al Kα source and depth profiling (via Ar⁺ cluster gun) delivers oxidation state speciation (e.g., Ce³⁺/Ce⁴⁺, Ti³⁺/Ti⁴⁺, Fe²⁺/Fe³⁺) with 0.05 at% sensitivity. We also map surface hydroxyl groups, adsorbed water, and organic ligands. For subsurface defects, electron paramagnetic resonance (EPR/ESR) at cryogenic temperatures (4 K) detects oxygen vacancies, F-centres, and unpaired electrons down to 10¹⁰ spins/g. Raman micro-spectroscopy (confocal, 325–1064 nm excitation) identifies vibrational fingerprints of specific oxide phases and defect-induced modes with 1 µm spatial resolution.

4. Elemental Composition & Trace Impurities: Using inductively coupled plasma mass spectrometry (ICP-MS) with a cleanroom (ISO 5) sample preparation, we quantify over 70 elements (including heavy metals, rare earths, and dopants) to sub-ppt levels. For mapping of heterogeneous samples, energy-dispersive X-ray spectroscopy (EDS) in STEM provides sub-nanometre resolution elemental maps, while time-of-flight secondary ion mass spectrometry (ToF-SIMS) delivers 3D distributions of molecular fragments with 50 nm lateral resolution.
5. Surface Area, Porosity & Agglomeration State: Our fully automated gas sorption analyzer (N₂/Ar at 77 K, Kr for ultra-low surface areas) yields BET specific surface area (range 0.0005–3000 m²/g) and pore size distribution via DFT, QSDFT, and BJH models covering 0.35–100 nm. For nanocrystals in dispersion, we combine ultracentrifugation sedimentation profiling with nanoparticle tracking analysis (NTA) to differentiate primary particles from hard/soft agglomerates – critical for predicting dispersion behaviour in formulations.
6. Optical and Electronic Properties: We measure UV-Vis-NIR absorption/transmission with integrating sphere (diffuse reflectance for powders) to determine bandgap energy (Eg) with ±0.01 eV accuracy and exciton peaks for quantum-confined oxides. Photoluminescence (PL) and time-resolved PL (ps resolution) characterise defect-related emission and carrier lifetimes. For conductive oxides (e.g., ITO, AZO), Hall effect measurements give carrier concentration, mobility, and resistivity from 80 K to 400 K.
7. Colloidal Stability and Surface Charge: Zeta potential analysis via electrophoretic light scattering (ELS) provides measurement from -500 mV to +500 mV with ±0.1 mV reproducibility across pH 2–12 and various ionic strengths. This directly predicts aggregation behaviour in biological or industrial media. We also offer interfacial rheology for nanocrystal-stabilised emulsions.
All analyses are performed under strict environmental controls (temperature, humidity, inert atmosphere where required) and are fully customisable to your specific oxide material (simple binary oxides, mixed metal oxides, doped systems, core-shell structures).
We go far beyond routine characterisation. Our advantages are built on decades of nanomaterials expertise and a relentless pursuit of precision:
▶ Highest Accuracy & Reproducibility in the Field: Our facility participates in international round-robin comparisons (e.g., VAMAS, ISO TC 229). Typical measurement uncertainties: size ±0.5%, phase content ±0.2 wt%, surface area ±0.3%. All instruments are calibrated daily with NIST-traceable standards or in-house reference nanocrystals.
▶ True Multi-Modal Correlative Analysis: Unlike single-service labs, we correlate the same sample batch across TEM, XRD, XPS, BET, and ICP-MS – revealing cause-effect relationships (e.g., defect concentration vs. bandgap shift). Our advanced reporting includes integrated data dashboards and expert interpretation notes.
▶ Rapid Turnaround Without Compromise: Standard analysis packages completed in 3–5 business days. For urgent process optimisation or failure analysis, we offer 24/7 priority service with results available within 24 hours (surcharge applicable but guaranteed).
▶ Compliance and Data Integrity Ready: We operate under ISO/IEC 17025:2017 accreditation and follow OECD guidelines for nanomaterials testing. Our electronic system complies with 21 CFR Part 11 and GxP requirements – ready for pharmaceutical, medical device, or automotive (IATF 16949) submissions.
▶ Expert Guidance Beyond Numbers: Our senior scientists (PhD level, average 15 years in oxide nanocrystal synthesis) provide a free 1-hour consultation with every project. We help you correlate characterisation data to your performance metrics – for example, linking oxygen vacancy concentration to catalytic activity or cytotoxicity.
▶ Flexible Sample Logistics: We accept dry powders, colloidal suspensions, solvent-dispersed, or substrate-deposited nanocrystals from any global location. Hazardous materials (e.g., nanotoxicology samples) are handled under certified biosafety protocols. Our custom sample holders for in-situ testing (e.g., heating/cooling stages in TEM) are available on request.
▶ Cost-Efficiency via High Throughput: With over 1,500 oxide nanocrystal batches analysed per year, our automated workflows reduce per-sample costs significantly. We offer academic discounts, start-up rates, and volume pricing for long-term quality assurance contracts.
Ultimately, we transform oxide nanocrystal characterisation from a routine check into a strategic insight engine – helping you speed up R&D, scale up reliably, and de-risk product certification. Whether you need a one-time forensic analysis or ongoing production monitoring, our team is ready to deliver the deepest data you have ever seen.
Take the next step – confidentially. Send us your oxide nanocrystal sample (as little as 5 mg or 1 mL of dispersion) through our secure portal. We will provide a custom proposal, including method selection and a firm quote, within one business day. A no-obligation technical call to discuss your specific challenges is always complementary. Let us show you what truly rigorous nanocrystal detection looks like.